LATW 2009 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Venue -- Committees

Scope

The IEEE Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault-tolerance with design, manufacturing and field considerations in mind.

Topics of interest include but are not limited to:

Analog Mixed Signal Test

Automatic Test Generation

Board and System Test

Built-In Self-Test

Defect-Based Test

Design and Synthesis for Testability

Design Verification/Validation

Design for Manufacturability

Design of Reliable Embedded Software

D&T for Electromagnetic Compatibility

Economics of Test

Fault Analysis and Diagnosis

Fault Modeling and Simulation

Fault-Tolerance in HW/SW

Memory Test and Repair

On-Line Testing

Process Control and Measurements

Radiation Hardening Techniques

System-on-Chip Test

Yield Optimization

Topic Coordinators

Analog and Mixed-Signal - M. Renovell - LIRMM, France
DFT & BIST - A. Orailoglu, UC San Diego, USA
Electromagnetic Compatibility - E. Sicard, INSA Toulouse, France
On-line Test and Fault Tolerance - D. K. Pradhan, Univ. of Bristol, UK
Radiation Ground Testing - R. Ecoffet, CNES, France
Software Testing - S. Vergilio, UFPR, Brazil
Verification and High Level Test - M. P. Garcia, Univ. Carlos III, Spain

Submissions

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Those interested in presenting recent results at the workshop are invited to submit papers using the IEEE format. PDF electronic submissions should be done via the workshop webpage: http://latw.tttc-events.org/.Accepted papers will optionally choose to be published in formal IEEE proceedings or in
a Digest of Papers. The Program Committee also welcomes proposals for embedded tutorials, panels
and special topic sessions. For additional information please contact one of the Program Co-Chairs.

Fabian Vargas vargas@computer.org
Raoul Velazco raoul.velazco@imag.fr

Key Dates

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Submission deadline: November 15th , 2008
Notification of acceptance: December 9th, 2008
Final copy deadline: January 9th, 2009

Venue

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LATW 2009 will be held in Buzios, Brazil. Originally settled by European pirates and slave traders, this happy mixture of many bloods prospered and became a picturesque fishing village. With more than 26 beaches that have a diversity of beauty never seen before, this small peninsula resembles a small island. It`s today a sophisticated beach resort with very active night life. Off season Búzios becomes a paradise for those who appreciate fine restaurants, arts and ecology. Búzios began its up scale resort with Brigitte Bardot in the 60’s. A statue of Bardot (the photo included in this CFP) is placed at Búzios harbour. Búzios lies 166 km (102 miles) from Rio de Janeiro. Rio de Janeiro, a city with a unique landscape. From Rio de Janeiro you can reach many other wonderful locations in Brazil.

Committees

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Organizing Committee

General Chairs
M. Lubaszewski - UFRGS, Brazil
luba@ece.ufrgs.br

Y. Zorian – Virage Logic Corp., USA
yervant.zorian@viragelogic.com

Program Chairs
F. Vargas - PUCRS, Brazil
R. Velazco – TIMA, France

Local Chair
Erika Cota– UFRGS, Brazil

Finance Chair
F. Kastensmidt – UFRGS, Brazil

Panel Chairs
M. Abadir – Freescale, USA
E. Bezerra - PUCRS, Brazil

Embedded Tutorials Chairs
M. Reorda - Polito, Italy
Z. Peng– Linköping Univ., Sweden

Publicity Chairs
R.Reis - UFRGS, Brazil
L. Anghel - TIMA, France

Publication Chair
J. L. Guntzel, UFSC, Brazil

Industry Liaison
C. Duenãs, Freescale, Brazil

IEEE D&T Liaison
K. Roy – Purdue Univ., USA

TTEP Tutorials Liaison
V. Champac - INAOE, Mexico

West Europe Liaison
M. Flottes - LIRMM, France

East Europe Liaison
R. Ubar - Talin Tech. Univ., Estonia

North-America Liaison
N. Touba, Univ. Texas at Austin, USA

Program Committee
J. Abraham, Univ. Texas, USA
V. D. Agrawal, Auburn Univ., USA
F. Azaïs, LIRMM, France
V. Avendano, Freescale, Mexico
L. Balado, UPC, Spain
A. Brun, Univ. Paris-Sud, France
J. Calvano - Braz. Navy, Brazil
L.Carro - UFRGS, Brazil
A. Chatterjee, Georgia Tech., USA
E. Duarte Junior, UFPR, Brazil
A. Diaz-Mendez, INAOE, Mexico
A. O. Fernandes, UFMG, Brazil
J. Figueras, UPC, Spain
F. Fiori, POLITO, Italy
P. Fouillat, CNFM, France
D.Gizopoulos - Univ. Piraeus, Greece
J. P. Gyvez, NXP, The Netherlands
J. Hayes, Univ. Michigan, USA
J. Huertas - IMSE/CNM, Spain
C. F. Hawkins, UNM, USA
A. Ivanov, Univ. British Columbia, Canada
D. Lupi, INTI, Argentina
E. J. Marinissen, NXP, The Netherlands
Y. Mita, Univ. Tokyo, Japan
F. Moraes, PUCRS, Brazil
G. Peretti, UTN-FR Villa Maria, Argentina
J. Perez, UROU, Uruguay
J. Rayas-Sanchez, ITESO, Mexico
E. Romero, UTN-FR Villa Maria, Argentina
A. Rueda, IMSE-CNM, Spain
J. Segura, U. Illes Balears, Spain
C. Silva, PUCP, Peru
M. Soma, Univ. Washington, USA
J. Sosnowski, Warsaw Univ. Techn., Poland
J. M. de Souza, FITec, Brazil
M. Strum - USP, Brazil
J. Velasco-Medina, Univ. del Valle, Colombia
S. Vergilio, UFPR, Brazil
T. Weber, UFRGS, Brazil
A. Zenteno, Intel, Mexico
A. Zorzo, PUCRS, Brazil

Steering Committee
V. Champac (Chair)
M. S. Lubaszewski
J. Huertas
F. Vargas
R. Velazco
Y. Zorian

For more information, visit us on the web at: http://www.event URL.com

The 10th IEEE Latin-American Test Workshop (LATW09 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and the IEEE Computer Society Design Automation Technical Committee.